ISBNs for secondary ion mass spectrometry

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secondary ion mass spectrometry matches 7 work(s)

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Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

Product Description: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) - Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions - Presented as concisely as believed possible with All sections prepared such that they can be read independently of each othe...read more

By Paul Van Der Heide

See complete details on each edition (1 edition listed)

Hardcover:

9781118480489 | John Wiley & Sons Inc, September 15, 2014, cover price $134.00 | About this edition: Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) - Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions - Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

Ion Spectroscopies for Surface Analysis

Product Description: Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many apÂ proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved...read more

By David M. Hercules (editor)

See complete details on each edition (2 editions listed)

Hardcover:

9780306437922 | Plenum Pub Corp, October 1, 1991, cover price $234.00

Paperback:

9781461366492 | Springer Verlag, October 24, 2012, cover price $99.00 | About this edition: Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces.

Surface Analysis of Polymers by Xps and Static Sims

Product Description: This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials...read more

By D. Briggs

See complete details on each edition (2 editions listed)

Hardcover:

9780521352222 | Cambridge Univ Pr, May 1, 1998, cover price $129.99 | About this edition: This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials.

Paperback:

9780521017534 | Cambridge Univ Pr, November 30, 2005, cover price $64.99 | About this edition: This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials.

Secondary Ion Mass Spectrometry: Principles and Applications

Product Description: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials...read more

By Alan Brown, Nicola M. Reed and J. C. Vickerman

See complete details on each edition (1 edition listed)

Hardcover:

9780198556251 | Clarendon Pr, February 1, 1990, cover price $95.00 | About this edition: This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis.

Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis

Product Description: Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H...read more (view table of contents, read Amazon.com's description)

By C. W. Magee, F. A. Stevie and R. G. Wilson

See complete details on each edition (1 edition listed)

Hardcover:

9780471519454 | Wiley-Interscience, January 1, 1990, cover price $230.00 | About this edition: Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A.

Handbook of Static Secondary Ion Mass Spectrometry

Product Description: A collection of spectral static SIMS spectra from over 100 compounds. Each compound listed has spectra over a 400 mass range for both positive and negative ions, with description of the spectra and information on how to extrapolate from this representative compound to others of its type...read more (view table of contents, read Amazon.com's description)

By D. Briggs, A. Brown and J. C. Vickerman

See complete details on each edition (1 edition listed)

Hardcover:

9780471916277 | John Wiley & Son Ltd, June 1, 1989, cover price $995.00 | About this edition: A collection of spectral static SIMS spectra from over 100 compounds.

Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends

Product Description: Other titles for the analytical chemistâ¦ Tandem Mass Spectrometry Edited by F. W. McLafferty Experts in tandem mass spectrometry bring this changing field up to date with a review of recent dramatic applications. Discusses amino acid sequencing, analysis of mixtures for trace level impurities, chemotaxonomy, and the classification of natural products...read more (view table of contents, read Amazon.com's description)

By A. Benninghoven, F. G. Rudenauer and H. W. Werner

See complete details on each edition (1 edition listed)

Hardcover:

9780471010562 | Wiley-Interscience, March 1, 1987, cover price $400.00 | About this edition: Other titles for the analytical chemistâ¦ Tandem Mass Spectrometry Edited by F.

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