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secondary ion mass spectrometry congresses matches 8 work(s)
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Cover for 9781500952860 Cover for 9780471927099 Cover for 9780471924852 Cover for 9780841209428 Cover for 9780387113722
cover image for 9781500952860
Product Description: Google really can do everything, and this book will show you how. Inside you will learn how to use Google Docs (the powerful cloud-based document editor), how to organize your photos with Google Picasa, tricks to Google searching you may have never heard of, how to create a blog with blogger, fine the best deals with Google shopping, and much, much more...read more
By Minute Help Guides (corporate author)

Hardcover:

9780387122441, titled "Ion Formation from Organic Solids: Proceedings of the 2nd Intl Conference, Munster, Germany, Sept 7-9, 1982" | Springer Verlag, May 1, 1983, cover price $59.95 | also contains Ion Formation from Organic Solids: Proceedings of the 2nd Intl Conference, Munster, Germany, Sept 7-9, 1982

Paperback:

9781500952860 | Createspace Independent Pub, August 25, 2014, cover price $12.99 | About this edition: Google really can do everything, and this book will show you how.

cover image for 9780471927099
Product Description: The fifth international workshop on Ion Formation from Organic Solids (IFOS V) was held at Lovanger, Sweden, 18-21 June 1989. The meeting was organized by the Ion Physics division, Department of Radiation Sciences, University of Uppsala...read more

Hardcover:

9780471927099 | John Wiley & Sons Inc, May 1, 1990, cover price $246.75 | About this edition: The fifth international workshop on Ion Formation from Organic Solids (IFOS V) was held at Lovanger, Sweden, 18-21 June 1989.

cover image for 9780471924852
Product Description: Contains 23 of the 42 papers presented at the Fourth International Conference on Ion Formation from Organic Solids, held at the University of Münster, in September of 1987. These contributions reflect recent progress in ion desorption by keV-particle bombardment, ion desorption by MeV-particle bombardment, ion desorption by laser irradiation, and positionization of neutrals...read more

Hardcover:

9780471924852 | John Wiley & Sons Inc, August 1, 1989, cover price $155.00 | About this edition: Contains 23 of the 42 papers presented at the Fourth International Conference on Ion Formation from Organic Solids, held at the University of Münster, in September of 1987.

Product Description: This volume contains the proceedings of the Fifth International Confer- ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni- ally...read more
By Richard J. Colton (editor)

Hardcover:

9780387162638 | Springer Verlag, May 1, 1986, cover price $89.95 | About this edition: This volume contains the proceedings of the Fifth International Confer- ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985.

cover image for 9780841209428
Product Description: Bridges the gap between SIMS and FAB mass spectrometry. Focuses on surface techniques that can use either SIMS or FAB mass spectrometry. Includes fundamentals, instrumental design, and applications. Demythologizes particle bombardment by addressing both the chemistry and physics involved...read more
By Philip A. Lyon (editor)

Hardcover:

9780841209428 | Amer Chemical Society, October 15, 1985, cover price $39.50 | About this edition: Bridges the gap between SIMS and FAB mass spectrometry.

cover image for 9780387113722
Product Description: Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants...read more

Hardcover:

9780387113722 | Springer Verlag, April 1, 1982, cover price $64.95 | About this edition: Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981.

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